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ORCIDAndrew D. Koffman
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2020 – today
- 2024
[c1]Stephan Schlamminger, J. Love, Andrew D. Koffman, Y. Wang:
Four Terminal-Pair Measurements of Ceramic Capacitors. I2MTC 2024: 1-4- 2023
- [j9]Stephan Schlamminger
, Andrew D. Koffman, James W. Schmidt, Bryan C. Waltrip, Yicheng Wang:
Measurement of the Frequency Dependence of Four Terminal-Pair Air Capacitors With a Vector Network Analyzer. IEEE Trans. Instrum. Meas. 72: 1-10 (2023) - 2022
- [j8]Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang:
Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge. IEEE Trans. Instrum. Meas. 71: 1-7 (2022) - 2020
- [j7]Kwang Min Yu, Dean G. Jarrett, Andrew D. Koffman, Albert F. Rigosi, Shamith U. Payagala, Kwon Sang Ryu, Jeon Hong Kang, Sang Hwa Lee:
Using a Natural Ratio to Compare DC and AC Resistances. IEEE Trans. Instrum. Meas. 69(8): 5614-5619 (2020)
2010 – 2019
- 2017
- [j6]Yinan Yu, Andrew D. Koffman, Yicheng Wang:
Nonlinearity Testing of Capacitance Bridges Using Programmable Capacitors. IEEE Trans. Instrum. Meas. 66(6): 1227-1231 (2017)
2000 – 2009
- 2007
- [j5]Yicheng Wang, Andrew D. Koffman, Gerald J. FitzPatrick:
Dissipation Factors of Fused-Silica Capacitors in the Audio Frequency Range. IEEE Trans. Instrum. Meas. 56(2): 624-627 (2007) - [j4]Svetlana Avramov-Zamurovic, Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang:
Evaluation of a Capacitance Scaling System. IEEE Trans. Instrum. Meas. 56(6): 2160-2163 (2007) - 2003
- [j3]Anne-Marie Jeffery, Andrew D. Koffman:
Improved 1-kHz capacitance calibration uncertainty. IEEE Trans. Instrum. Meas. 52(4): 1284-1288 (2003) - 2000
- [j2]Andrew D. Koffman, Svetlana Avramov-Zamurovic, Bryan Cristopher Waltrip, Nile M. Oldham:
Uncertainty analysis for four terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz. IEEE Trans. Instrum. Meas. 49(2): 346-348 (2000) - [j1]Svetlana Avramov-Zamurovic, Andrew D. Koffman, Nile M. Oldham, Bryan Cristopher Waltrip:
The sensitivity of a method to predict a capacitor's frequency characteristic. IEEE Trans. Instrum. Meas. 49(2): 398-404 (2000)
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