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ORCIDMeng Miao
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2020 – today
- 2024
[j10]Meng Miao
, Saide Saide, Silvia Ratna, Muhammad Muflih:
Business Continuity Innovation in Disruption Time: Sociotechnical Systems, Business Analytics, Virtual Business, and Mediating Role of Knowledge Absorptive Capacity. IEEE Trans. Engineering Management 71: 13201-13212 (2024)- 2023
- [j9]Meng Miao, Saide Saide, Didi Muwardi:
Positioning the Knowledge Creation and Business Strategy on Banking Industry in a Developing Country. IEEE Trans. Engineering Management 70(6): 2197-2205 (2023) - 2020
- [c2]You Li, Meng Miao, Robert Gauthier:
ESD Protection Design Overview in Advanced SOI and Bulk FinFET Technologies. CICC 2020: 1-4 - [c1]Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier:
Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation. IRPS 2020: 1-4
2010 – 2019
- 2016
- [j8]Wei Liang, Aihua Dong, Hang Li, Meng Miao, Chung-Chen Kuo, Maxim Klebanov, Juin J. Liou:
Characteristics of ESD protection devices operated under elevated temperatures. Microelectron. Reliab. 66: 46-51 (2016) - 2015
- [j7]Meng Miao, Yuanzhong Paul Zhou, Javier A. Salcedo, Jean-Jacques Hajjar, Juin J. Liou:
Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation. Microelectron. Reliab. 55(1): 15-23 (2015) - 2012
- [j6]Jian Wu, Shurong Dong, Mingliang Li, Meng Miao, Fei Ma, Jianfeng Zheng, Yan Han:
A novel power-clamp assisted complementary MOSFET for robust ESD protection. Microelectron. Reliab. 52(8): 1593-1597 (2012) - [j5]Meng Miao, Shurong Dong, Mingliang Li, Jian Wu, Fei Ma, Jianfeng Zheng, Yan Han:
A novel gate-suppression technique for ESD protection. Microelectron. Reliab. 52(8): 1598-1601 (2012) - [j4]Fei Ma, Yan Han, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Cheng-gong Han, Kehan Zhu:
Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process. Microelectron. Reliab. 52(8): 1640-1644 (2012) - 2011
- [j3]Yan Han, Bo Song, Shurong Dong, Mingliang Li, Fei Ma, Meng Miao, Kehan Zhu:
Study of current saturation behaviors in dual direction SCR for ESD applications. Microelectron. Reliab. 51(2): 332-336 (2011) - [j2]Fei Ma, Yan Han, Bo Song, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Kehan Zhu:
Substrate-engineered GGNMOS for low trigger voltage ESD in 65 nm CMOS process. Microelectron. Reliab. 51(12): 2124-2128 (2011) - 2010
- [j1]Bo Song, Yan Han, Shurong Dong, Fei Ma, Mingliang Li, Meng Miao, Kehan Zhu:
Compact MOS-triggered SCR with faster turn-on speed for ESD protection. Microelectron. Reliab. 50(9-11): 1393-1397 (2010)
Coauthor Index
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