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ORCIDYongfu Li 0003
Person information
- affiliation: GLOBALFOUNDRIES Singapore Pte. Ltd.
Other persons with the same name
- Yongfu Li — disambiguation page
- Yongfu Li 0001
![[0000-0002-7701-8351]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0002-7701-8351")
— Chongqing University of Posts and Telecommunications, College of Automation, China (and 1 more) - Yongfu Li 0002 — Shanghai Jiao Tong University, Shanghai, China
- Yongfu Li 0004 — Shandong University, Qingdao, China
- Yongfu Li 0005 — Department of Architecture, Shanghai University, Shanghai , China
- Yongfu Li 0006 — Hefei University of Technology, Hefei, China
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2010 – 2019
- 2018
[c2]I-Lun Tseng, Yongfu Li, Valerio Perez, Vikas Tripathi, Zhao Chuan Lee, Yoong Seang Jonathan Ong:
An Automated System for Checking Lithography Friendliness of Standard Cells. APCCAS 2018: 261-265- [c1]Yongfu Li, I-Lun Tseng, Zhao Chuan Lee, Valerio Perez, Vikas Tripathi, Yoong Seang Jonathan Ong:
Identifying Lithography Weak-Points of Standard Cells with Partial Pattern Matching. ISVLSI 2018: 417-422 - [i8]Yongfu Li, Chin Hui Lee, Wan Chia Ang, Kok Peng Chua, Yoong Seang Jonathan Ong, Chiu Wing Colin Hui:
Constraining the Synopsys Pin Access Checker Utility for Improved Standard Cells Library Verification Flow. CoRR abs/1805.10012 (2018) - [i7]Vikas Tripathi, Yongfu Li, Zhao Chuan Lee, I-Lun Tseng, Jason Khaw, Jonathan Ong:
In Design DFM Rule Scoring and Fixing Method using ICV. CoRR abs/1805.10016 (2018) - [i6]Yongfu Li, Valerio Perez, I-Lun Tseng, Zhao Chuan Lee, Vikas Tripathi, Jason Khaw, Yoong Seang Jonathan Ong:
Advanced In-Design Auto-Fixing Flow for Cell Abutment Pattern Matching Weakpoints. CoRR abs/1805.10283 (2018) - [i5]Yongfu Li, Wan Chia Ang, Chin Hui Lee, Kok Peng Chua, Yoong Seang Jonathan Ong, Chiu Wing Colin Hui:
Multiple-Lithography-Compliant Verification for Standard Cell Library Development Flow. CoRR abs/1805.10745 (2018) - [i4]Yongfu Li, Wan Chia Ang, Chin Hui Lee, Kok Peng Chua, Yoong Seang Jonathan Ong, Chiu Wing Colin Hui:
Standard Cell Library Evaluation with Multiple lithography-compliant verification and Improved Synopsys Pin Access Checking Utility. CoRR abs/1805.11426 (2018) - [i3]I-Lun Tseng, Valerio Perez, Yongfu Li, Zhao Chuan Lee, Vikas Tripathi, Yoong Seang Jonathan Ong:
Creation and Fixing of Lithography Hotspots with Synopsys Tools. CoRR abs/1808.05998 (2018) - [i2]Vikas Tripathi, Valerio Perez, Yongfu Li, Zhao Chuan Lee, I-Lun Tseng, Jonathan Ong:
Context-Aware DFM Rule Analysis and Scoring Using Machine Learning. CoRR abs/1808.05999 (2018) - [i1]I-Lun Tseng, Yongfu Li, Valerio Perez, Vikas Tripathi, Zhao Chuan Lee, Yoong Seang Jonathan Ong:
An Automated System for Checking Lithography Friendliness of Standard Cells. CoRR abs/1810.01446 (2018)
Coauthor Index
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