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ORCIDShin-Jang Shen
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2010 – 2019
- 2015
[j5]Chun-Hsiung Hung, Meng-Fan Chang, Yih-Shan Yang, Yao-Jen Kuo, Tzu-Neng Lai, Shin-Jang Shen, Jo-Yu Hsu, Shuo-Nan Hung, Hang-Ting Lue
, Yen-Hao Shih, Shih-Lin Huang, Ti-Wen Chen, Tzung Shen Chen, Chung Kuang Chen, Chi-Yu Hung, Chih-Yuan Lu:
Layer-Aware Program-and-Read Schemes for 3D Stackable Vertical-Gate BE-SONOS NAND Flash Against Cross-Layer Process Variations. IEEE J. Solid State Circuits 50(6): 1491-1501 (2015)- [j4]Meng-Fan Chang, Yu-Fan Lin, Yen-Chen Liu, Jui-Jen Wu, Shin-Jang Shen, Wu-Chin Tsai, Yu-Der Chih:
An Asymmetric-Voltage-Biased Current-Mode Sensing Scheme for Fast-Read Embedded Flash Macros. IEEE J. Solid State Circuits 50(9): 2188-2198 (2015) - 2013
- [j3]Meng-Fan Chang, Shin-Jang Shen, Chia-Chi Liu, Che-Wei Wu, Yu-Fan Lin, Ya-Chin King, Chorng-Jung Lin, Hung-Jen Liao, Yu-Der Chih, Hiroyuki Yamauchi:
An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory. IEEE J. Solid State Circuits 48(3): 864-877 (2013) - [j2]Meng-Fan Chang, Che-Wei Wu, Chia-Chen Kuo, Shin-Jang Shen, Sue-Meng Yang, Ku-Feng Lin, Wen-Chao Shen, Ya-Chin King, Chorng-Jung Lin, Yu-Der Chih:
A Low-Voltage Bulk-Drain-Driven Read Scheme for Sub-0.5 V 4 Mb 65 nm Logic-Process Compatible Embedded Resistive RAM (ReRAM) Macro. IEEE J. Solid State Circuits 48(9): 2250-2259 (2013) - 2012
- [c2]Meng-Fan Chang, Che-Wei Wu, Chia-Chen Kuo, Shin-Jang Shen, Ku-Feng Lin, Shu-Meng Yang, Ya-Chin King, Chorng-Jung Lin, Yu-Der Chih:
A 0.5V 4Mb logic-process compatible embedded resistive RAM (ReRAM) in 65nm CMOS using low-voltage current-mode sensing scheme with 45ns random read time. ISSCC 2012: 434-436 - 2011
- [c1]Meng-Fan Chang, Shin-Jang Shen, Chia-Chi Liu, Che-Wei Wu, Yu-Fan Lin, Shang-Chi Wu, Chia-En Huang, Han-Chao Lai, Ya-Chin King, Chorng-Jung Lin, Hung-Jen Liao, Yu-Der Chih, Hiroyuki Yamauchi:
An offset-tolerant current-sampling-based sense amplifier for Sub-100nA-cell-current nonvolatile memory. ISSCC 2011: 206-208
2000 – 2009
- 2009
- [j1]Meng-Fan Chang, Shin-Jang Shen:
A Process Variation Tolerant Embedded Split-Gate Flash Memory Using Pre-Stable Current Sensing Scheme. IEEE J. Solid State Circuits 44(3): 987-994 (2009)
Coauthor Index
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