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Massimo Lanzoni
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- affiliation: University of Bologna, Italy
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2020 – today
- 2024
- [j9]Augusto Pieracci, Jacopo Nanni, Giovanni Tartarini, Massimo Lanzoni:
A Novel Approach to Raman Distributed Temperature-Sensing System for Short-Range Applications. Sensors 24(9): 2669 (2024)
2000 – 2009
- 2009
- [j8]Massimo Lanzoni, Claudio Stagni, Bruno Riccò:
Smart sensors for fast biological analysis. Microelectron. J. 40(9): 1345-1349 (2009) - 2006
- [j7]Fabio Cibin, Massimo Lanzoni, Luca Benini, Bruno Riccò:
Linux-Based Data Acquisition and Processing on Palmtop Computer. IEEE Trans. Instrum. Meas. 55(6): 2039-2044 (2006) - [c6]Carlotta Guiducci, Claudio Stagni, M. Brocchi, Massimo Lanzoni, Bruno Riccò, Augusto Nascetti, Davide Caputo, A. De Cesare:
Innovative Optoeletronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices. VLSI-SoC (Selected Papers) 2006: 37-53 - [c5]Carlotta Guiducci, Claudio Stagni, M. Brocchi, Massimo Lanzoni, Bruno Riccò, Augusto Nascetti, Davide Caputo, Giampiero de Cesare:
Innovative Optoelectronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices. VLSI-SoC 2006: 169-174 - 2005
- [c4]Claudio Stagni, Carlotta Guiducci, Massimo Lanzoni, Luca Benini, Bruno Riccò:
Hardware-Software Design of a Smart Sensor for Fully-Electronic DNA Hybridization Detection. DATE 2005: 198-203 - 2003
- [j6]Marco Grossi, Massimo Lanzoni, Bruno Riccò:
Program schemes for multilevel flash memories. Proc. IEEE 91(4): 594-601 (2003) - 2001
- [c3]Roberto Versari, David Esseni, Gianluca Falavigna, Massimo Lanzoni, Bruno Riccò:
Optimized programming of multilevel flash EEPROMs. ICECS 2001: 945-948
1990 – 1999
- 1998
- [j5]Massimo Lanzoni, G. Tondi, P. Galbiati, Bruno Riccò:
Automatic and continuous offset compensation of MOS operational amplifiers using floating-gate transistors. IEEE J. Solid State Circuits 33(2): 287-290 (1998) - [j4]Bruno Riccò, Guido Torelli, Massimo Lanzoni, Alessandro Manstretta, Herman E. Maes, Donato Montanari, Alberto Modelli:
Nonvolatile multilevel memories for digital applications. Proc. IEEE 86(12): 2399-2423 (1998) - 1995
- [j3]Massimo Lanzoni, Bruno Riccò:
Experimental characterization of circuits for controlled programming of floating-gate MOSFET's. IEEE J. Solid State Circuits 30(6): 706-709 (1995) - 1994
- [j2]Massimo Lanzoni, Luciano Briozzo, Bruno Riccò:
A novel approach to controlled programming of tunnel-based floating-gate MOSFETs. IEEE J. Solid State Circuits 29(2): 147-150 (1994) - 1990
- [j1]Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt:
Testing of E2PROM aging and endurance: A case study. Eur. Trans. Telecommun. 1(2): 201-207 (1990) - [c2]Roberto Menozzi, Massimo Lanzoni, Luca Selmi, Bruno Riccò:
An improved procedure to test CMOS ICs for latch-up. ITC 1990: 1028-1034
1980 – 1989
- 1989
- [c1]Massimo Lanzoni, Piero Olivo, Bruno Riccò:
A Testing Technique to Characterize E^2PROM's Aging and Endurance. ITC 1989: 391-396
Coauthor Index
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