"An improved procedure to test CMOS ICs for latch-up."

Roberto Menozzi et al. (1990)

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DOI: 10.1109/TEST.1990.114126

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-03

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Roberto Menozzi, Massimo Lanzoni, Luca Selmi, Bruno Riccò:
An improved procedure to test CMOS ICs for latch-up. ITC 1990: 1028-1034

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