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Michael W. Ruprecht

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2003
[j2]
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Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt:
A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. Microelectron. Reliab. 43(1): 17-41 (2003)
2002
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Guenther Benstetter, Michael W. Ruprecht, Douglas B. Hunt:
A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. Microelectron. Reliab. 42(3): 307-316 (2002)

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