"A review of ULSI failure analysis techniques for DRAMs. Part II: Defect ..."

Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt (2003)

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DOI: 10.1016/S0026-2714(02)00295-0

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type: Journal Article

metadata version: 2022-12-07

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Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt:
A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. Microelectron. Reliab. 43(1): 17-41 (2003)

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