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2020 – today
- 2022
[j8]Huanze Zeng
, Argon Chen:
Multivariate multi-layer classifier. Pattern Recognit. 131: 108896 (2022)- 2021
- [j7]Zixin Shen, Amos Hong, Argon Chen:
Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters. Adv. Eng. Informatics 48: 101283 (2021) - [j6]Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma:
Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing. Int. J. Intell. Syst. 36(6): 2618-2638 (2021) - [j5]Huanze Zeng, Argon Chen:
Binary multi-layer classifier. Inf. Sci. 562: 220-239 (2021) - 2020
- [j4]Zixin Shen, Argon Chen:
Comprehensive relative importance analysis and its applications to high dimensional gene expression data analysis. Knowl. Based Syst. 203: 106120 (2020)
2010 – 2019
- 2019
- [c6]Huanze Zeng, Argon Chen:
Classification Tree with Hybrid Splitting Mechanism. SISY 2019: 61-66 - 2018
- [c5]Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma:
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing. CASE 2018: 1316-1321 - 2015
- [j3]Lars Mönch, Argon Chen, Myoungsoo (Andy) Ham, James Morrison:
Applications of quantitative methods in semiconductor manufacturing. Comput. Oper. Res. 53: 250-251 (2015) - 2014
- [c4]Ling-Ying Chiu, Argon Chen:
A variance-reduction method for thyroid nodule boundary detection on ultrasound images. CASE 2014: 681-685 - 2012
- [c3]Amos Hong, Argon Chen:
Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis. WSC 2012: 197:1-197:11 - 2011
- [j2]Jakey Blue, Argon Chen:
Spatial Variance Spectrum Analysis and Its Application to Unsupervised Detection of Systematic Wafer Spatial Variations. IEEE Trans Autom. Sci. Eng. 8(1): 56-66 (2011)
2000 – 2009
- 2009
- [c2]Argon Chen, Sean Hsueh, Jakey Blue:
Optimum sampling for track PEB CD Integrated Metrology. CASE 2009: 439-442 - 2008
- [c1]Mark W. Brantley, Loo Hay Lee, Chun-Hung Chen, Argon Chen:
Optimal sampling in design of experiment for simulation-based stochastic optimization. CASE 2008: 388-393 - 2002
- [j1]Argon Chen, Elsayed A. Elsayed:
Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step Changes. Technometrics 44(4): 379-389 (2002)
Coauthor Index
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