"Many-to-many comprehensive relative importance analysis and its ..."

Zixin Shen, Amos Hong, Argon Chen (2021)

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DOI: 10.1016/J.AEI.2021.101283

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type: Journal Article

metadata version: 2021-07-13

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Zixin Shen, Amos Hong, Argon Chen:
Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters. Adv. Eng. Informatics 48: 101283 (2021)

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