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ORCIDMichael H. Schulz
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1990 – 1999
- 1992
[j8]Hans-Joachim Wunderlich, Michael H. Schulz:
Prüfgerechter Entwurf und Test hochintegrierter Schaltungen. Inform. Spektrum 15(1): 23-32 (1992)- [j7]Franz Fink, Karl Fuchs, Michael H. Schulz:
Robust and Nonrobust Path Delay Fault Simulation by Parallel Processing of Patterns. IEEE Trans. Computers 41(12): 1527-1536 (1992) - [j6]Thomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler:
A hierarchical test pattern generation system based on high-level primitives. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 34-44 (1992) - 1991
- [j5]Elisabeth Auth, Michael H. Schulz:
A Test-Pattern-Generation Algorithm for Sequential Circuits. IEEE Des. Test Comput. 8(2): 72-86 (1991) - [j4]Karl Fuchs, Franz Fink, Michael H. Schulz:
DYNAMITE: an efficient automatic test pattern generation system for path delay faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(10): 1323-1335 (1991) - 1990
- [c6]Bernhard H. Seiß, Michael H. Schulz:
Ein neues, effizientes Verfahren zum Testpunkteeinbau in kombinatorischen Schaltungen. Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme 1990: 195-206
1980 – 1989
- 1989
- [j3]Michael H. Schulz, Elisabeth Auth:
Improved deterministic test pattern generation with applications to redundancy identification. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(7): 811-816 (1989) - [c5]Michael H. Schulz, Franz Fink, Karl Fuchs:
Parallel Pattern Fault Simulation of Path Delay Faults. DAC 1989: 357-363 - [c4]Michael H. Schulz, Karl Fuchs, Franz Fink:
Advanced automatic test pattern generation techniques for path delay faults. FTCS 1989: 44-51 - [c3]Michael H. Schulz, Elisabeth Auth:
Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. ITC 1989: 28-37 - [c2]Thomas M. Sarfert, Remo G. Markgraf, Erwin Trischler, Michael H. Schulz:
Hierarchical Test Pattern Generation Based on High-Level Primitives. ITC 1989: 470-479 - 1988
- [b1]Michael H. Schulz:
Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität. Technical University Munich, Germany, Informatik-Fachberichte 173, Springer 1988, ISBN 3-540-50051-0, pp. 1-170 - [j2]Michael H. Schulz, Erwin Trischler, Thomas M. Sarfert:
SOCRATES: a highly efficient automatic test pattern generation system. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(1): 126-137 (1988) - [c1]Michael H. Schulz, Elisabeth Auth:
Advanced automatic test pattern generation and redundancy identification techniques. FTCS 1988: 30-35 - 1987
- [j1]Kurt Antreich, Michael H. Schulz:
Accelerated Fault Simulation and Fault Grading in Combinational Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 6(5): 704-712 (1987)
Coauthor Index
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