"A hierarchical test pattern generation system based on high-level primitives."

Thomas M. Sarfert et al. (1992)

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DOI: 10.1109/43.108617

access: closed

type: Journal Article

metadata version: 2020-09-24

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Thomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler:
A hierarchical test pattern generation system based on high-level primitives. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 34-44 (1992)

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