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Daniel B. Jackson

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affiliation: Digital Equipment Corporation, Hudson, MA, USA

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Journal Articles

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1992
[j1]
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  dblp key:
  - journals/dtj/JacksonBDFK92
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  - https://dblp.org/rec/journals/dtj/JacksonBDFK92
Daniel B. Jackson, David A. Bell, Brian S. Doyle, Bruce J. Fishbein, David B. Krakauer:
Transistor Hot Carrier Reliability Assurance in CMOS Technologies. Digit. Tech. J. 4(2): 100-113 (1992)

Conference and Workshop Papers

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1998
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  - conf/dac/GowanBJ98
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Michael K. Gowan, Larry L. Biro, Daniel B. Jackson:
Power Considerations in the Design of the Alpha 21264 Microprocessor. DAC 1998: 726-731
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Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson:
Testability access of the high speed test features in the Alpha 21264 microprocessor. ITC 1998: 487-495

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