"Transistor Hot Carrier Reliability Assurance in CMOS Technologies."

Daniel B. Jackson et al. (1992)

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DOI: —

access: open

type: Journal Article

metadata version: 2023-01-23

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Daniel B. Jackson, David A. Bell, Brian S. Doyle, Bruce J. Fishbein, David B. Krakauer:
Transistor Hot Carrier Reliability Assurance in CMOS Technologies. Digit. Tech. J. 4(2): 100-113 (1992)

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