"Testability access of the high speed test features in the Alpha 21264 ..."

Dilip K. Bhavsar et al. (1998)

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DOI: 10.1109/TEST.1998.743190

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson:
Testability access of the high speed test features in the Alpha 21264 microprocessor. ITC 1998: 487-495

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