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Luz Balado
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Journal Articles
- 2020
- [j8]Álvaro Gómez-Pau, Emili Lupon, Luz Balado, Joan Figueras:
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures. IET Circuits Devices Syst. 14(5): 611-618 (2020) - 2017
- [j7]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Multi-Directional Space Tessellation to Improve the Decision Boundary in Indirect Mixed-Signal Testing. J. Electron. Test. 33(3): 315-328 (2017) - 2016
- [j6]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Indirect test of M-S circuits using multiple specification band guarding. Integr. 55: 415-424 (2016) - [j5]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Efficient Production Binning Using Octree Tessellation in the Alternate Measurements Space. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(8): 1386-1395 (2016) - 2009
- [j4]Luz Balado, Emili Lupon, Joan Figueras, Miquel Roca, Eugeni Isern, Rodrigo Picos:
Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(4): 754-762 (2009) - 2005
- [j3]R. Sanahuja, Victor Barcons, Luz Balado, Joan Figueras:
Testing Biquad Filters under Parametric Shifts Using X-Y Zoning. J. Electron. Test. 21(3): 257-265 (2005) - 2004
- [j2]Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. J. Electron. Test. 20(2): 143-153 (2004) - [j1]Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras:
On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electron. Test. 20(4): 345-355 (2004)
Conference and Workshop Papers
- 2015
- [c11]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
Analog circuits testing using digitally coded indirect measurements. DTIS 2015: 1-6 - 2014
- [c10]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
M-S specification binning based on digitally coded indirect measurements. ETS 2014: 1-6 - 2013
- [c9]Álvaro Gómez-Pau, Luz Balado, Joan Figueras:
M-S test based on specification validation using octrees in the measure space. ETS 2013: 1-6 - 2010
- [c8]Alvaro Gómez, Ricard Sanahuja, Luz Balado, Joan Figueras:
Analog circuit test based on a digital signature. DATE 2010: 1641-1644 - 2006
- [c7]Luz Balado, Emili Lupon, L. García, Rosa Rodríguez-Montañés, Joan Figueras:
Lissajous Based Mixed-Signal Testing for N-Observable Signals. DDECS 2006: 125-130 - 2004
- [c6]Marie-Lise Flottes, Yves Bertrand, Luz Balado, Emili Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, Nicoleta Pricopi, Hans-Joachim Wunderlich:
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. DELTA 2004: 135-139 - [c5]Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
BIST Technique by Equally Spaced Test Vector Sequences. VTS 2004: 206-216 - 2003
- [c4]Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
On the selection of efficient arithmetic additive test pattern generators [logic test]. ETW 2003: 9-14 - [c3]Yves Bertrand, Marie-Lise Flottes, Luz Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, Nicoleta Pricopi, Hans-Joachim Wunderlich, Jean-Pierre Van der Heyden:
Test Engineering Education in Europe: the EuNICE-Test Project. MSE 2003: 85-86 - 2002
- [c2]Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. IOLTW 2002: 99-103 - [c1]Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Luz Balado, Joan Figueras:
On High-Quality, Low Energy BIST Preparation at RT-Level. LATW 2002: 52-57
Coauthor Index
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