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Haiyong Chen
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2020 – today
- 2024
- [j28]Shenshen Zhao, Haiyong Chen, Chuhan Wang, Yatong Zhou, Zhengtao Zhang:
RGR-Net: Refined Graph Reasoning Network for multi-height hotspot defect detection in photovoltaic farms. Expert Syst. Appl. 245: 123034 (2024) - [j27]Chuhan Wang, Haiyong Chen, Shenshen Zhao, Yining Wang, Zhen Cao:
A Low-Cost Defect Segmentation System Based on IoT for Large-Scale Photovoltaic Manufacturing. IEEE Internet Things J. 11(9): 16928-16940 (2024) - [j26]Chuhan Wang, Haiyong Chen, Shenshen Zhao:
RERN: Rich Edge Features Refinement Detection Network for Polycrystalline Solar Cell Defect Segmentation. IEEE Trans. Ind. Informatics 20(2): 1408-1419 (2024) - [j25]Shenshen Zhao, Haiyong Chen, Chuhan Wang, Zhong Zhang:
SSN: Shift Suppression Network for Endogenous Shift of Photovoltaic Defect Detection. IEEE Trans. Ind. Informatics 20(3): 4685-4697 (2024) - [i4]Haiyong Chen, Yaxiu Zhang, Yan Zhang, Xin Zhang, Xingwei Yan:
GDDS: A Single Domain Generalized Defect Detection Frame of Open World Scenario using Gather and Distribute Domain-shift Suppression Network. CoRR abs/2407.13417 (2024) - 2023
- [j24]Yingxuan Yin, Yuegang Tao, Cailu Wang, Haiyong Chen:
Correction to: Local and global robustness with q-step delay for max-plus linear systems. Discret. Event Dyn. Syst. 33(4): 507 (2023) - [j23]Shiji Wang, Haiyong Chen, Kun Liu, Ying Zhou, Huichuan Feng:
Meta-FSDet: a meta-learning based detector for few-shot defects of photovoltaic modules. J. Intell. Manuf. 34(8): 3413-3427 (2023) - [j22]Binyi Su, Zhong Zhou, Haiyong Chen:
PVEL-AD: A Large-Scale Open-World Dataset for Photovoltaic Cell Anomaly Detection. IEEE Trans. Ind. Informatics 19(1): 404-413 (2023) - 2022
- [j21]Yingxuan Yin, Yuegang Tao, Cailu Wang, Haiyong Chen:
Local and global robustness with q-step delay for max-plus linear systems. Discret. Event Dyn. Syst. 32(2): 231-251 (2022) - [j20]Kun Liu, Rui Meng, Longteng Li, Jingkun Mao, Haiyong Chen:
SiSL-Net: Saliency-guided self-supervised learning network for image classification. Neurocomputing 510: 193-202 (2022) - [j19]Shubhendu Kumar Singh, Raj Pradip Khawale, Haiyong Chen, Haolong Zhang, Rahul Rai:
Personal protective equipments (PPEs) for COVID-19: a product lifecycle perspective. Int. J. Prod. Res. 60(10): 3282-3303 (2022) - [j18]He Chen, Ran Zhang, Weipeng Liu, Haiyong Chen:
A time optimal trajectory planning method for offshore cranes with ship roll motions. J. Frankl. Inst. 359(12): 6099-6122 (2022) - [j17]Binyi Su, Haiyong Chen, Zhong Zhou:
BAF-Detector: An Efficient CNN-Based Detector for Photovoltaic Cell Defect Detection. IEEE Trans. Ind. Electron. 69(3): 3161-3171 (2022) - [j16]Haiyong Chen, Mengyuan Song, Zezhi Zhang, Kun Liu:
Detection of Surface Defects in Solar Cells by Bidirectional-Path Feature Pyramid Group-Wise Attention Detector. IEEE Trans. Instrum. Meas. 71: 1-9 (2022) - [c12]Kun Liu, Junfei Xie, Mei Chen, Haiyong Chen, Weipeng Liu:
MA-UNet++: A Multi-Attention Guided U-Net++ for COVID-19 CT Segmentation. ASCC 2022: 682-687 - [d1]Binyi Su, Zhong Zhou, Haiyong Chen:
Photovoltaic cell anomaly detection dataset. IEEE DataPort, 2022 - 2021
- [j15]Wa Zhang, He Chen, Haiyong Chen, Weipeng Liu:
A Time Optimal Trajectory Planning Method for Double-Pendulum Crane Systems With Obstacle Avoidance. IEEE Access 9: 13022-13030 (2021) - [j14]Kun Liu, Haowei Yan, Kai Meng, Haiyong Chen, Hasan Sajid:
Iterating Tensor Voting: A Perceptual Grouping Approach for Crack Detection on EL Images. IEEE Trans Autom. Sci. Eng. 18(2): 831-839 (2021) - [j13]Binyi Su, Haiyong Chen, Peng Chen, Gui-Bin Bian, Kun Liu, Weipeng Liu:
Deep Learning-Based Solar-Cell Manufacturing Defect Detection With Complementary Attention Network. IEEE Trans. Ind. Informatics 17(6): 4084-4095 (2021) - [j12]Binyi Su, Haiyong Chen, Kun Liu, Weipeng Liu:
RCAG-Net: Residual Channelwise Attention Gate Network for Hot Spot Defect Detection of Photovoltaic Farms. IEEE Trans. Instrum. Meas. 70: 1-14 (2021) - [c11]Yingxuan Yin, Cailu Wang, Haiyong Chen, Yuegang Tao:
Modeling and Cycle Analysis of Traffic Signal Systems Based on Timed Networks. VALUETOOLS 2021: 221-232 - [i3]Binyi Su, Zhong Zhou, Haiyong Chen, Xiaochun Cao:
SIGAN: A Novel Image Generation Method for Solar Cell Defect Segmentation and Augmentation. CoRR abs/2104.04953 (2021) - 2020
- [j11]Muhammad Rameez Ur Rahman, Haiyong Chen:
Defects Inspection in Polycrystalline Solar Cells Electroluminescence Images Using Deep Learning. IEEE Access 8: 40547-40558 (2020) - [j10]Haiyong Chen, Yue Pang, Qidi Hu, Kun Liu:
Solar cell surface defect inspection based on multispectral convolutional neural network. J. Intell. Manuf. 31(2): 453-468 (2020) - [j9]Haiyong Chen, Qidi Hu, Baoshuo Zhai, He Chen, Kun Liu:
A robust weakly supervised learning of deep Conv-Nets for surface defect inspection. Neural Comput. Appl. 32(15): 11229-11244 (2020) - [j8]Kun Liu, Nana Luo, Aimei Li, Ying Tian, Hasan Sajid, Haiyong Chen:
A New Self-Reference Image Decomposition Algorithm for Strip Steel Surface Defect Detection. IEEE Trans. Instrum. Meas. 69(7): 4732-4741 (2020) - [i2]Binyi Su, Haiyong Chen, Zhong Zhou:
BAF-Detector: An Efficient CNN-Based Detector for Photovoltaic Solar Cell Defect Detection. CoRR abs/2012.10631 (2020)
2010 – 2019
- 2019
- [j7]Haiyong Chen, Jiali Liu, Shuang Wang, Kun Liu:
Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background. IEEE Access 7: 134318-134329 (2019) - [j6]Heying Wang, Jiawei Zhang, Ying Tian, Haiyong Chen, Hexu Sun, Kun Liu:
A Simple Guidance Template-Based Defect Detection Method for Strip Steel Surfaces. IEEE Trans. Ind. Informatics 15(5): 2798-2809 (2019) - [j5]Binyi Su, Haiyong Chen, Yifan Zhu, Weipeng Liu, Kun Liu:
Classification of Manufacturing Defects in Multicrystalline Solar Cells With Novel Feature Descriptor. IEEE Trans. Instrum. Meas. 68(12): 4675-4688 (2019) - [c10]Muhammad Rameez Ur Rahman, Haiyong Chen, Wen Xi:
U-Net Based Defects Inspection in Photovoltaic Electroluminecscence Images. ICBK 2019: 215-220 - [c9]Kun Liu, Jiangrui Han, Haiyong Chen, Haowei Yan, Peng Yang:
Defect detection on EL images based on deep feature optimized by metric learning for imbalanced data. ICAC 2019: 1-5 - [c8]Kun Liu, Aimei Li, Xi Wen, Haiyong Chen, Peng Yang:
Steel Surface Defect Detection Using GAN and One-Class Classifier. ICAC 2019: 1-6 - 2018
- [j4]Haiyong Chen, Yuejiao Cui, Ruina Qiu, Peng Chen, Weipeng Liu, Kun Liu:
Image-Alignment Based Matching for Irregular Contour Defects Detection. IEEE Access 6: 68749-68759 (2018) - [c7]Haiyong Chen, Jiali Liu, Shuang Wang, Kun Liu, Peng Yang:
Robust dislocation defects region segmentation for polysilicon wafer image. ICAC 2018: 1-6 - [c6]Haiyong Chen, Xiaofang Zhang, Jiali Liu, Huifang Zhao, Peng Yang:
Robust Visual Detection for Vague Scratches defect in inhomogeneous surface. ICAC 2018: 1-6 - [c5]Kun Liu, Kai Meng, Haiyong Chen, Peng Yang:
A self-reference scheme based on structure-texture decomposition for crack defect detection with electroluminescence images. ICAC 2018: 1-6 - [c4]Haiyong Chen, Huifang Zhao, Da Han, Haowei Yan, Xiaofang Zhang, Kun Liu:
Robust Crack Defect Detection in Inhomogeneously Textured Surface of Near Infrared Images. PRCV (1) 2018: 511-523 - [i1]Haiyong Chen, Yue Pang, Qidi Hu, Kun Liu:
Solar Cell Surface Defect Inspection Based on Multispectral Convolutional Neural Network. CoRR abs/1812.06220 (2018) - 2017
- [j3]Kun Liu, Heying Wang, Haiyong Chen, Erqing Qu, Ying Tian, Hexu Sun:
Steel Surface Defect Detection Using a New Haar-Weibull-Variance Model in Unsupervised Manner. IEEE Trans. Instrum. Meas. 66(10): 2585-2596 (2017) - 2011
- [j2]Haiyong Chen, Hailiang Chen:
A novel algorithm of fingerprint encryption using minutiae-based transformation. Pattern Recognit. Lett. 32(2): 305-309 (2011) - 2010
- [j1]Haiyong Chen, Hailiang Chen:
A hybrid scheme for securing fingerprint templates. Int. J. Inf. Sec. 9(5): 353-361 (2010) - [c3]Haiyong Chen, Jiangwei Li, Guansheng Xing, Jia Xing, Hexu Sun:
Trajectory tracking control of a Macro-Micro welding robot based on the vision navigation. ROBIO 2010: 667-672
2000 – 2009
- 2007
- [c2]Haiyong Chen, Hongwei Sun, Kwok-Yan Lam:
A fast and elastic fingerprint matching algorithm using minutiae-centered circular regions. SECURWARE 2007: 211-215 - 2006
- [c1]Haiyong Chen, Suyun Wang, Ying Ji:
Robust PCA by Projection Pursuit and Mean Shift Analysis. ISDA (3) 2006: 3-8
Coauthor Index
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