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Paolo Spirito

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2010 – 2019

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2012
[j12]
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Michele Riccio, Giuseppe De Falco, Luca Maresca, Giovanni Breglio, Ettore Napoli, Andrea Irace, Yohei Iwahashi, Paolo Spirito:
3D electro-thermal simulations of wide area power devices operating in avalanche condition. Microelectron. Reliab. 52(9-10): 2385-2390 (2012)
[j11]
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Maurizio Costagliola, Davide De Caro, Antonio Girardi, Roberto Izzi, Niccolò Rinaldi, Marco Spirito, Paolo Spirito:
An Experimental Power-Lines Model for Digital ASICs Based on Transmission Lines. IEEE Trans. Very Large Scale Integr. Syst. 20(1): 162-166 (2012)
2010
[j10]
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Lucio Rossi, Michele Riccio, Ettore Napoli, Andrea Irace, Giovanni Breglio, Paolo Spirito:
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing. Microelectron. Reliab. 50(9-11): 1479-1483 (2010)
[j9]
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Michele Riccio, Lucio Rossi, Andrea Irace, Ettore Napoli, Giovanni Breglio, Paolo Spirito, Ryuzo Tagami, Yoshihito Mizuno:
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography. Microelectron. Reliab. 50(9-11): 1725-1730 (2010)

2000 – 2009

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2009
[j8]
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Lucio Rossi, Michele Riccio, Ettore Napoli, Andrea Irace, Giovanni Breglio, Paolo Spirito:
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention. Microelectron. Reliab. 49(9-11): 1386-1390 (2009)
2008
[j7]
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Giovanni Breglio, Andrea Irace, Ettore Napoli, Michele Riccio, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta:
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography. Microelectron. Reliab. 48(8-9): 1432-1434 (2008)
2007
[j6]
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Andrea Irace, Giovanni Breglio, Paolo Spirito:
New developments of THERMOS³, a tool for 3D electro-thermal simulation of smart power MOSFETs. Microelectron. Reliab. 47(9-11): 1696-1700 (2007)
[j5]
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Giovanni Breglio, Andrea Irace, Ettore Napoli, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta:
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. Microelectron. Reliab. 47(9-11): 1756-1760 (2007)
2006
[j4]
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Andrea Irace, Giovanni Breglio, Paolo Spirito, A. Bricconi, Diego Raffo, Luigi Merlin:
Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode. Microelectron. Reliab. 46(9-11): 1784-1789 (2006)
2005
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Andrea Irace, Giovanni Breglio, Paolo Spirito, Romeo Letor, Sebastiano Russo:
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectron. Reliab. 45(9-11): 1706-1710 (2005)
2004
[j2]
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E. D'Arcangelo, Andrea Irace, Giovanni Breglio, Paolo Spirito:
Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching. Microelectron. Reliab. 44(9-11): 1455-1459 (2004)

1990 – 1999

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1990
[j1]
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Salvatore Bellone, Paolo Spirito:
A new test structure for recombination measurements in thin si layers for VLSI structures. Eur. Trans. Telecommun. 1(3): 351-358 (1990)

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