"Reliability enhancement with the aid of transient infrared thermal ..."

Andrea Irace et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.087

access: closed

type: Journal Article

metadata version: 2021-10-14

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Andrea Irace, Giovanni Breglio, Paolo Spirito, Romeo Letor, Sebastiano Russo:
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectron. Reliab. 45(9-11): 1706-1710 (2005)

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