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T. Ueta

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2000 – 2009

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2008
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Giovanni Breglio, Andrea Irace, Ettore Napoli, Michele Riccio, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta:
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography. Microelectron. Reliab. 48(8-9): 1432-1434 (2008)
2007
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Giovanni Breglio, Andrea Irace, Ettore Napoli, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta:
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. Microelectron. Reliab. 47(9-11): 1756-1760 (2007)

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