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Journal Articles
- 2023
[j19]Bong-Jin Yum:
A bibliography of the literature on process capability indices (PCIs): 2010-2021, Part I: Books, review/overview papers, and univariate PCI-related papers. Qual. Reliab. Eng. Int. 39(4): 1413-1438 (2023)- [j18]Bong-Jin Yum:
A bibliography of the literature on process capability indices (PCIs): 2010-2021, Part II: Multivariate PCI- and functional PCI-related papers, special applications, software packages, and omitted papers. Qual. Reliab. Eng. Int. 39(4): 1439-1464 (2023) - 2018
- [j17]Woojin Soh, Heeyoung Kim, Bong-Jin Yum:
Application of kernel principal component analysis to multi-characteristic parameter design problems. Ann. Oper. Res. 263(1-2): 69-91 (2018) - 2016
- [j16]Taejin Park, Bong-Jin Yum, Ying Hung, Young-Seon Jeong, Myong K. Jeong:
Robust Kriging models in computer experiments. J. Oper. Res. Soc. 67(4): 644-653 (2016) - [j15]Woojin Soh, Heeyoung Kim, Bong-Jin Yum:
A Multivariate Loss Function Approach to Robust Design of Systems with Multiple Performance Characteristics. Qual. Reliab. Eng. Int. 32(8): 2685-2700 (2016) - 2015
- [j14]Sangheum Hwang
, Dohyun Kim, Myong K. Jeong, Bong-Jin Yum:
Robust kernel-based regression with bounded influence for outliers. J. Oper. Res. Soc. 66(8): 1385-1398 (2015) - 2011
- [j13]Jae-Ryung Jung, Bong-Jin Yum:
Artificial neural network based approach for dynamic parameter design. Expert Syst. Appl. 38(1): 504-510 (2011) - [j12]Jeong Han, Norman Kim, Myong K. Jeong, Bong-Jin Yum:
Comparisons of classification methods in the original and pattern spaces. Expert Syst. Appl. 38(10): 12432-12438 (2011) - [j11]YongSoo Kim, Bong-Jin Yum:
Recommender system based on click stream data using association rule mining. Expert Syst. Appl. 38(10): 13320-13327 (2011) - [j10]Jeong Han, Norman Kim, Bong-Jin Yum, Myong K. Jeong:
Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern. Expert Syst. Appl. 38(11): 13857-13862 (2011) - [j9]Bong-Jin Yum, Kwan-Woo Kim:
A bibliography of the literature on process capability indices: 2000-2009. Qual. Reliab. Eng. Int. 27(3): 251-268 (2011) - 2008
- [j8]Jin Seon Kim, Bong-Jin Yum:
Selection between Weibull and lognormal distributions: A comparative simulation study. Comput. Stat. Data Anal. 53(2): 477-485 (2008) - [j7]Seung-Hoon Tong, Bong-Jin Yum:
A dual burn-in policy for defect-tolerant memory products using the number of repairs as a quality indicator. Microelectron. Reliab. 48(3): 471-480 (2008) - 2007
- [j6]Hyoup-Sang Yoon, Bong-Jin Yum:
A Compensatory Packet Dropping Routine for Proportional Loss Rate Differentiation. IEICE Trans. Commun. 90-B(10): 2865-2873 (2007) - [j5]Hyoup-Sang Yoon, Bong-Jin Yum:
Robust design of communication systems: The case of expedited forwarding of voice traffic in differentiated services networks. Int. J. Commun. Syst. 20(10): 1131-1154 (2007) - 2005
- [j4]YongSoo Kim, Bong-Jin Yum, Junehwa Song, Su Myeon Kim:
Development of a recommender system based on navigational and behavioral patterns of customers in e-commerce sites. Expert Syst. Appl. 28(2): 381-393 (2005) - [j3]Dohyun Kim, Bong-Jin Yum:
Collaborative filtering based on iterative principal component analysis. Expert Syst. Appl. 28(4): 823-830 (2005) - 2004
- [j2]Young-Sang Kim, Bong-Jin Yum:
Robust design of multilayer feedforward neural networks: an experimental approach. Eng. Appl. Artif. Intell. 17(3): 249-263 (2004) - 2003
- [j1]Yang-Gil Park, Bong-Jin Yum:
Development of performance measures for dynamic parameter design problems. Int. J. Manuf. Technol. Manag. 5(1/2): 91-104 (2003)
Conference and Workshop Papers
- 2012
- [c2]Bong-Jin Yum, Jae Hoon Koo, Seong-Jun Kim:
Analysis of defective patterns on wafers in semiconductor manufacturing: A bibliographical review. CASE 2012: 86-90 - 2002
- [c1]Yeo-Hun Yoon, Young-Sang Kim, Sung-Jun Kim, Bong-Jin Yum:
Development of a Framework for Analyzing Process Monitoring Data with Applications to Semiconductor Manufacturing Process. COMPSTAT 2002: 297-302
Coauthor Index
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