"Pattern selection approaches for the logical analysis of data considering ..."

Jeong Han et al. (2011)

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DOI: 10.1016/J.ESWA.2011.04.189

access: closed

type: Journal Article

metadata version: 2017-05-26

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Jeong Han, Norman Kim, Bong-Jin Yum, Myong K. Jeong:
Pattern selection approaches for the logical analysis of data considering the outliers and the coverage of a pattern. Expert Syst. Appl. 38(11): 13857-13862 (2011)

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