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ORCIDHideyuki Iwata
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2010 – 2019
- 2018
[j8]Hideyuki Iwata, Yuji Inoue:
Expansion of Optical Access Network to Rural Area. IEICE Trans. Commun. 101-B(4): 966-971 (2018)- 2017
- [c2]Monica Perusquía-Hernández, Takahisa Enomoto, Tiago Martins, Mai Otsuki, Hideyuki Iwata, Kenji Suzuki:
Embodied interface for levitation and navigation in a 3D large space. AH 2017: 4
2000 – 2009
- 2009
- [j7]Toshihiro Matsuda, Shinsuke Ishimaru, Shingo Nohara, Hideyuki Iwata, Kiyotaka Komoku, Takayuki Morishita, Takashi Ohzone:
Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide. IEICE Trans. Electron. 92-C(12): 1523-1530 (2009) - [c1]H. Oshiyama, Toshihiro Matsuda, K. Suzuki, Hideyuki Iwata, Takashi Ohzone:
A VDD independent temperature sensor circuit with scaled CMOS process. ASP-DAC 2009: 111-112 - 2008
- [j6]Toshihiro Matsuda, Yuya Sugiyama, Keita Nohara, Kazuhiro Morita, Hideyuki Iwata, Takashi Ohzone, Takayuki Morishita, Kiyotaka Komoku:
A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs. IEICE Trans. Electron. 91-C(8): 1331-1337 (2008) - 2007
- [j5]Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata:
A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width. IEICE Trans. Electron. 90-C(2): 515-522 (2007) - [j4]Takashi Ohzone, Tatsuaki Sadamoto, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata:
A CMOS Temperature Sensor Circuit. IEICE Trans. Electron. 90-C(4): 895-902 (2007) - 2006
- [j3]Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata:
A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Trans. Electron. 89-C(9): 1351-1357 (2006) - 2005
- [j2]Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma:
A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Trans. Electron. 88-C(5): 811-816 (2005) - [j1]Toshihiro Matsuda, Ryuichi Minami, Akira Kanamori, Hideyuki Iwata, Takashi Ohzone, Shinya Yamamoto, Takashi Ihara, Shigeki Nakajima:
A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit. IEICE Trans. Electron. 88-C(5): 1087-1093 (2005)
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