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"A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in ..."
Takashi Ohzone et al. (2006)
- Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata:
A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Trans. Electron. 89-C(9): 1351-1357 (2006)
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