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2020 – today
- 2024
[j12]Zhen-Feng Jiang, Xi-Zhan Wei, Jia-Lin Kang, David Shan-Hill Wong, Yuan Yao
, Yao-Chen Chuang, Shi-Shang Jang, John Di-Yi Ou:
Deep learning model predictive control of a high-density polyethylene reactor with a physics-guided sequence-to-sequence model with memory. Comput. Chem. Eng. 189: 108790 (2024)- 2020
- [j11]Cheng-Hung Chou, Haibin Wu, Jia-Lin Kang, David Shan-Hill Wong, Yuan Yao, Yao-Chen Chuang, Shi-Shang Jang, John Di-Yi Ou:
Physically Consistent Soft-Sensor Development Using Sequence-to-Sequence Neural Networks. IEEE Trans. Ind. Informatics 16(4): 2829-2838 (2020) - [j10]Yajun Fan, Bo Tao, Ying Zheng, Shi-Shang Jang:
A Data-Driven Soft Sensor Based on Multilayer Perceptron Neural Network With a Double LASSO Approach. IEEE Trans. Instrum. Meas. 69(7): 3972-3979 (2020)
2010 – 2019
- 2017
- [j9]Kai Sun, Shao-Hsuan Huang, David Shan-Hill Wong, Shi-Shang Jang:
Design and Application of a Variable Selection Method for Multilayer Perceptron Neural Network With LASSO. IEEE Trans. Neural Networks Learn. Syst. 28(6): 1386-1396 (2017) - 2015
- [i1]Bing Ai, David Shan-Hill Wong, Shi-Shang Jang:
Stability analysis of semiconductor manufacturing process with EWMA run-to-run controllers. CoRR abs/1510.08946 (2015) - 2013
- [j8]Chin-Feng Chen, Kun-Jia Wu, Chuei-Tin Chang, David Shan-Hill Wong, Shi-Shang Jang:
Generation and verification of optimal dispatching policies for multi-product multi-tool semiconductor manufacturing processes. Comput. Chem. Eng. 52: 112-121 (2013) - 2012
- [j7]Tian-Hong Pan, David Shan-Hill Wong, Shi-Shang Jang:
Chamber Matching of Semiconductor Manufacturing Process Using Statistical Analysis. IEEE Trans. Syst. Man Cybern. Part C 42(4): 571-576 (2012) - 2011
- [j6]Tian-Hong Pan, Bi-Qi Sheng, David Shan-Hill Wong, Shi-Shang Jang:
A Virtual Metrology System for Predicting End-of-Line Electrical Properties Using a MANCOVA Model With Tools Clustering. IEEE Trans. Ind. Informatics 7(2): 187-195 (2011) - [c4]Yu-Jeng Lin, Tian-Hong Pan, David Shan-Hill Wong, Shi-Shang Jang:
Plantwide control of CO2 capture by absorption and stripping using monoethanolamine solution. ACC 2011: 5067-5072 - 2010
- [j5]Ming-Da Ma, David Shan-Hill Wong, Shi-Shang Jang, Sheng-Tsaing Tseng:
Fault Detection based on Statistical Multivariate Analysis and Microarray-type Visualization. IEEE Trans. Ind. Informatics 6(1): 18-24 (2010) - [j4]Ying Zheng, Bing Ai, David Shan-Hill Wong, Shi-Shang Jang, Jie Zhang, Yanwei Wang:
An EWMA algorithm with a cycled resetting (CR) discount factor for drift and fault of high-mix Run-To-Run Control. IEEE Trans. Ind. Informatics 6(2): 229-242 (2010)
2000 – 2009
- 2008
- [c3]An-Guo Chao, S. T. Tseng, David Shan-Hill Wong, Shi-Shang Jang, Shui-Pin Lee:
Systematic applications of multivariate analysis to monitoring of equipment health in semiconductor manufacturing. WSC 2008: 2330-2334 - 2007
- [j3]Mark P. Brynildsen, Tung-Yun Wu, Shi-Shang Jang, James C. Liao:
Biological network mapping and source signal deduction. Bioinform. 23(14): 1783-1791 (2007) - 2006
- [j2]Chen-Wei Yeh, Shi-Shang Jang:
The Development of Information Guided Evolution Algorithm for Global Optimization. J. Glob. Optim. 36(4): 517-535 (2006) - [p1]Shi-Shang Jang, David Shan-Hill Wong, Junghui Chen:
Intelligent Experimental Design Using an Artificial Neural Network Meta Model and Information Theory. Integrated Intelligent Systems for Engineering Design 2006: 258-273 - 2004
- [j1]Chia Huang Yen, David Shan-Hill Wong, Shi-Shang Jang:
Solution of trim-loss problem by an integrated simulated annealing and ordinal optimization approach. J. Intell. Manuf. 15(5): 701-709 (2004) - 2003
- [c2]Ji-Zheng Chu, Po-Feng Tsai, Wen-Yen Tsai, Shi-Shang Jang, David Shan-Hill Wong, Shyan-Shu Shieh, Pin-Ho Lin, Shi-Jer Jiang:
An Experimental Study of Model Predictive Control Based on Artificial Neural Networks. KES 2003: 1296-1302 - 2001
- [c1]Po-Feng Tsai, Shi-Shang Jang, Shyan-Shu Shieh:
Predictive control of batch processes using principal surface/space analysis and fuzzy clustering empirical models. ACC 2001: 1005-1009
Coauthor Index
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