default search action

combined dblp search
author search
venue search
publication search

ask others

T. Moise

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2020 – today

see FAQ

What is the meaning of the colors in the publication lists?

2024
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/irps/RodriguezDavilaFFMBGQY24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/RodriguezDavilaFFMBGQY24
Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young:
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. IRPS 2024: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.