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Dominique Carisetti

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2010 – 2019

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2012
[j2]
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  - journals/mr/LambertLCKTTBCMLM12
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  - https://dblp.org/rec/journals/mr/LambertLCKTTBCMLM12
Benoit Lambert, Nathalie Labat, Dominique Carisetti, Serge Karboyan, Jean-Guy Tartarin, Jim Thorpe, Laurent Brunel, Arnaud Curutchet, Nathalie Malbert, Eddy Latu-Romain, Michel Mermoux:
Evidence of relationship between mechanical stress and leakage current in AlGaN/GaN transistor after storage test. Microelectron. Reliab. 52(9-10): 2184-2187 (2012)

2000 – 2009

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2009
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  - journals/mr/PiazzaDOMCW09
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Michele Piazza, Christian Dua, Mourad Oualli, Erwan Morvan, Dominique Carisetti, Frédéric Wyczisk:
Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs. Microelectron. Reliab. 49(9-11): 1222-1225 (2009)

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