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ORCIDChristian G. Zoellin
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Books and Theses
- 2015
[b1]Christian G. Zöllin:
Test planning for low-power built-in self test. University of Stuttgart, 2015
Journal Articles
- 2018
- [j5]Michael Jordan, Nicholas P. Sardino, Meghan McGrath, Christian G. Zoellin, Thomas E. Morris, Cecilia Carranza Lewis, Greg Vance, Bruce Naylor, Jim Pickel, M. Sueli Almeida, Dave Wierbowski, Chris Meyer, Reinhard Bündgen, Michael Zagorski, Hans Schoone, Kathryn Voss:
Enabling pervasive encryption through IBM Z stack innovations. IBM J. Res. Dev. 62(2/3): 2:1-2:11 (2018) - [j4]Christian G. Zoellin, Oliver Draese, Jonathan D. Bradbury, Christian Jacobi, Aditya Puranik, Peter Sutton, Robert Tokumaru:
New database compression assists in the IBM z14 processor. IBM J. Res. Dev. 62(2/3): 12:1-12:11 (2018) - 2011
- [j3]Rafal Baranowski, Stefano Di Carlo
, Nadereh Hatami, Michael E. Imhof, Michael A. Kochte, Paolo Prinetto, Hans-Joachim Wunderlich, Christian G. Zoellin:
Efficient multi-level fault simulation of HW/SW systems for structural faults. Sci. China Inf. Sci. 54(9): 1784-1796 (2011) - 2010
- [j2]Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich:
Efficient Concurrent Self-Test with Partially Specified Patterns. J. Electron. Test. 26(5): 581-594 (2010) - 2005
- [j1]Arthur A. Bright, Ruud A. Haring, Marc Boris Dombrowa, Martin Ohmacht, Dirk Hoenicke, Sarabjeet Singh, James A. Marcella, Robert F. Lembach, Steve M. Douskey, Matthew R. Ellavsky, Christian G. Zoellin, Alan Gara:
Blue Gene/L compute chip: Synthesis, timing, and physical design. IBM J. Res. Dev. 49(2-3): 277-288 (2005)
Conference and Workshop Papers
- 2021
- [c17]Brian W. Thompto, Dung Q. Nguyen, José E. Moreira, Ramon Bertran, Hans M. Jacobson, Richard J. Eickemeyer, Rahul M. Rao, Michael Goulet, Marcy Byers, Christopher J. Gonzalez, Karthik Swaminathan, Nagu R. Dhanwada, Silvia M. Müller, Andreas Wagner, Satish Kumar Sadasivam, Robert K. Montoye, William J. Starke, Christian G. Zoellin, Michael S. Floyd, Jeffrey Stuecheli, Nandhini Chandramoorthy, John-David Wellman, Alper Buyuktosunoglu, Matthias Pflanz, Balaram Sinharoy, Pradip Bose:
Energy Efficiency Boost in the AI-Infused POWER10 Processor. ISCA 2021: 29-42 - 2018
- [c16]Christopher J. Berry, James D. Warnock, John Isakson, John Badar, Brian Bell, Frank Malgioglio, Guenter Mayer, Dina Hamid, Jesse Surprise, David Wolpert, Ofer Geva, Bill Huott, Leon J. Sigal, Sean M. Carey, Richard F. Rizzolo, Ricardo Nigaglioni, Mark Cichanowski, Dureseti Chidambarrao, Christian Jacobi, Anthony Saporito, Arthur O'neill, Robert J. Sonnelitter, Christian G. Zoellin, Michael H. Wood, José Neves:
IBM z14™: 14nm microprocessor for the next-generation mainframe. ISSCC 2018: 36-38 - 2017
- [c15]Christoph Jäschke, Ulla Herter, Claudia Wolkober, Carsten Schmitt, Christian G. Zoellin:
Static netlist verification for IBM high-frequency processors using a tree-grammar. DATE 2017: 1552-1557 - 2010
- [c14]Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto:
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level. Asian Test Symposium 2010: 3-8 - [c13]Michael A. Kochte, Marcel Schaal, Hans-Joachim Wunderlich, Christian G. Zoellin:
Efficient fault simulation on many-core processors. DAC 2010: 380-385 - [c12]Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto:
System reliability evaluation using concurrent multi-level simulation of structural faults. ITC 2010: 817 - [c11]Christian G. Zoellin, Hans-Joachim Wunderlich:
Low-power test planning for arbitrary at-speed delay-test clock schemes. VTS 2010: 93-98 - 2009
- [c10]Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto:
Test exploration and validation using transaction level models. DATE 2009: 1250-1253 - [c9]Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich:
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead. ETS 2009: 53-58 - 2008
- [c8]Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding:
Scan chain clustering for test power reduction. DAC 2008: 828-833 - [c7]Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Hans-Joachim Wunderlich:
Test Set Stripping Limiting the Maximum Number of Specified Bits. DELTA 2008: 581-586 - [c6]Christian G. Zoellin, Hans-Joachim Wunderlich, Ilia Polian, Bernd Becker:
Selective Hardening in Early Design Steps. ETS 2008: 185-190 - [c5]Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin:
Integrating Scan Design and Soft Error Correction in Low-Power Applications. IOLTS 2008: 59-64 - 2007
- [c4]Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra:
Scan Test Planning for Power Reduction. DAC 2007: 521-526 - [c3]Sybille Hellebrand, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, Bernd Straube:
A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction. DFT 2007: 50-58 - [c2]Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef:
Programmable deterministic Built-In Self-Test. ITC 2007: 1-9 - 2006
- [c1]Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra:
BIST Power Reduction Using Scan-Chain Disable in the Cell Processor. ITC 2006: 1-8
Coauthor Index
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