"Scan Test Planning for Power Reduction."

Michael E. Imhof et al. (2007)

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DOI: 10.1145/1278480.1278614

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra:
Scan Test Planning for Power Reduction. DAC 2007: 521-526

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