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A. Kalboussi
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2020 – today
- 2024
- [i1]Wiem Haj Ammar, Aicha Boujnah, Antoine Baron, Aimen Boubaker, Adel Kalboussi, Kamal Lmimouni, Sébastien Pecqueur:
A Temporal Filter to Extract Doped Conducting Polymer Information Features from an Electronic Nose. CoRR abs/2401.00684 (2024) - 2023
- [c4]Sami Ghedira, Abdelaali Fargi, Adel Kalboussi:
On The Effect Of Optical Power On Quantum Dot HEMT Transistor. SSD 2023: 856-861
2010 – 2019
- 2017
- [j7]Slah Hlali, Neila Hizem, Liviu Militaru, A. Kalboussi, Abdelkader Souifi:
Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. Microelectron. Reliab. 75: 154-161 (2017) - [j6]S. Chatbouri, M. Troudi, A. Kalboussi, A. Souifi:
Interface traps effect on the charge transport mechanisms in metal oxide semiconductor structures based on silicon nanocrystals. Microelectron. Reliab. 78: 227-232 (2017) - 2015
- [c3]Jihen Landolsi, Ferid Rehimi, Adel Kalboussi:
Macroscopic traffic modeling on a network. GSCIT 2015: 1-5 - 2013
- [c2]S. Chatbouri, M. Troudi, Nabil Sghaier, A. Kalboussi, Dominique Drouin, V. Aimez, A. Souifi:
Effect of illumination on the electron transport mechanisms in Silicon nanocrystal-based nanopixels. SSD 2013: 1-4 - 2012
- [c1]B. Hafsi, Aimen Boubaker, I. Krout, Adel Kalboussi:
Study and modeling neural memory based on single electron transistor using Simon simulator. SSD 2012: 1-6
2000 – 2009
- 2009
- [j5]Aimen Boubaker, M. Troudi, Nabil Sghaier, A. Souifi, Nicolas Baboux, A. Kalboussi:
Electrical characteristics and modelling of multi-island single-electron transistor using SIMON simulator. Microelectron. J. 40(3): 543-546 (2009) - 2007
- [j4]Neila Hizem, A. Kalboussi, R. Adhiri, A. Souifi:
Blue/green luminescence based on Zn(S)Se/GaAs heterostructures. Microelectron. J. 38(4-5): 496-500 (2007) - [j3]Aimen Boubaker, Nabil Sghaier, M. Troudi, A. Kalboussi, Nicolas Baboux, A. Souifi:
A new SIMPLORER model for single-electron transistors. Microelectron. J. 38(8-9): 894-899 (2007) - [j2]M. Troudi, Nabil Sghaier, Aimen Boubaker, A. Souifi, A. Kalboussi:
Macro-modeling for the compact simulation of single electron transistor using SIMPLORER. Microelectron. J. 38(12): 1156-1160 (2007) - 2006
- [j1]Nabil Sghaier, M'Hamed Trabelsi, Ne. Sghaier, Liviu Militaru, Abdelkader Souifi, Adel Kalboussi, Noureddine Yacoubi:
Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications. Microelectron. J. 37(11): 1399-1403 (2006)
Coauthor Index
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