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Philipp Steinmann

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2020 – today

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2024
[c2]
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  - conf/irps/SteinmannLSPDR24
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Philipp Steinmann, Daniel J. Lichtenwalner, Shane Stein, Jae-Hyung Park, Suman Das, Sei-Hyung Ryu:
Measurement of the $D_{it}$ Changes Under BTI-Stress in 4H-SiC FETs Using the Subthreshold Slope Method. IRPS 2024: 58
2022
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Satyaki Ganguly, Daniel J. Lichtenwalner, Caleb Isaacson, Donald A. Gajewski, Philipp Steinmann, Ryan Foarde, Brett Hull, Sei-Hyung Ryu, Scott Allen, John W. Palmour:
Negative Gate Bias TDDB evaluation of n-Channel SiC Vertical Power MOSFETs. IRPS 2022: 8

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