"Measurement of the $D_{it}$ Changes Under BTI-Stress in 4H-SiC FETs Using ..."

Philipp Steinmann et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529457

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type: Conference or Workshop Paper

metadata version: 2024-10-06

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Philipp Steinmann, Daniel J. Lichtenwalner, Shane Stein, Jae-Hyung Park, Suman Das, Sei-Hyung Ryu:
Measurement of the $D_{it}$ Changes Under BTI-Stress in 4H-SiC FETs Using the Subthreshold Slope Method. IRPS 2024: 58

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