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ORCIDXiao Sun 0002
Person information
- affiliation: Motorola
- affiliation: Texas A&M
Other persons with the same name
- Xiao Sun — disambiguation page
- Xiao Sun 0001
![[0000-0001-7459-804X]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0001-7459-804X")
— Shanghai Artificial Intelligence Laboratory, China (and 1 more) - Xiao Sun 0003 — Hefei University of Technology, School of Computer and Information, China (and 2 more)
- Xiao Sun 0004 — Stony Brook University, Stony Brook , NY, USA
- Xiao Sun 0005 — Waseda University, Shinjuku-ku, Japan
- Xiao Sun 0006 — Southeast University, Nanjing, China
- Xiao Sun 0007 — Key Laboratory of Power Electronics and Electric Drive, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China
- Xiao Sun 0008 — Central South University, Changsha, China
- Xiao Sun 0009 — School of Geodesy and Geomatics, Wuhan University, Wuhan, China
- Xiao Sun 0010 — Pennsylvania State University, University Park, PA, USA
- Xiao Sun 0011 — Peking University, Beijing, China
- Xiao Sun 0012 — Tsinghua University, Department of Automation, National Engineering Laboratory for E-Commerce Technologies, Beijing, China
- Xiao Sun 0013 — Meta Platforms, Inc., Menlo Park, CA, USA (and 2 more)
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1990 – 1999
- 1998
[c7]Xiao Sun, Carmie Hull:
Functional Verification Coverage vs. Physical Stuck-at Fault Coverage. DFT 1998: 108-116- 1995
- [c6]Xiao-Tao Chen, Wei-Kang Huang, Fabrizio Lombardi, Xiao Sun:
A row-based FPGA for single and multiple stuck-at fault detection. DFT 1995: 225-233 - 1994
- [c5]Xiao Sun, Fabrizio Lombardi:
Matrix multiplication on the MasPar using distance insensitive communication schemes. ISPAN 1994: 358-365 - 1993
- [c4]Xiao Sun, Fabrizio Lombardi, Donatella Sciuto:
On the minimal test set for single fault location. EURO-DAC 1993: 265-270 - [c3]Xiao Sun, Fabrizio Lombardi:
On the design for testability of sequential circuits. VTS 1993: 147-150 - 1992
- [c2]Xiao Sun, Yinan N. Shen, Fabrizio Lombardi:
On the Verification and Validation of Protocols with High Fault Coverage Using UIO Sequences. SRDS 1992: 196-203 - 1991
- [c1]Xiao Sun, Yinan N. Shen, Fabrizio Lombardi, Donatella Sciuto:
Protocol Conformance Testing by Discriminating UIO Sequences. PSTV 1991: 349-364
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