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Journal Articles
- 2011
[j15]Giovanni Busatto
, D. Bisello, Giuseppe Currò, Piero Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, Annunziata Sanseverino, L. Silvestrin, M. Tessaro, Francesco Velardi, Jeffery Wyss:
A new test methodology for an exhaustive study of single-event-effects on power MOSFETs. Microelectron. Reliab. 51(9-11): 1995-1998 (2011)- 2010
- [j14]Giovanni Busatto, Giuseppe Currò, Francesco Iannuzzo, Alberto Porzio, Annunziata Sanseverino, Francesco Velardi:
Experimental study and numerical investigation on the formation of single event gate damages induced on medium voltage power MOSFET. Microelectron. Reliab. 50(9-11): 1842-1847 (2010) - 2009
- [j13]Giovanni Busatto, Giuseppe Currò, Francesco Iannuzzo, Alberto Porzio, Annunziata Sanseverino, Francesco Velardi:
Experimental study about gate oxide damages in patterned MOS capacitor irradiated with heavy ions. Microelectron. Reliab. 49(9-11): 1033-1037 (2009) - 2008
- [j12]Giovanni Busatto, Giuseppe Currò, Francesco Iannuzzo, Alberto Porzio, Annunziata Sanseverino, Francesco Velardi:
Experimental evidence of "latent gate oxide damages" in medium voltage power MOSFET as a result of heavy ions exposure. Microelectron. Reliab. 48(8-9): 1306-1309 (2008) - 2007
- [j11]Giuseppe Currò, Marco Camalleri, Denise Calì, Francesca Monforte, Fortunato Neri:
Carrier trapping in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices. Microelectron. Reliab. 47(4-5): 798-801 (2007) - [j10]Giacomo Barletta, Giuseppe Currò:
Evaluation of the generation mechanisms at surface and in the bulk of the silicon by current transient technique. Microelectron. Reliab. 47(4-5): 810-814 (2007) - [j9]Alessandra Cascio, Giuseppe Currò, A. Cavagnoli:
Total ionizing dose reliability of thin SiO2 in PowerMOSFET devices. Microelectron. Reliab. 47(4-5): 815-818 (2007) - [j8]Giuseppe Currò, Marco Camalleri, Denise Calì, Francesca Monforte, Fortunato Neri:
Interface states and traps in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices. Microelectron. Reliab. 47(4-5): 819-821 (2007) - [j7]Francesca Monforte, Marco Camalleri, Denise Calì, Giuseppe Currò, Enza Fazio, Fortunato Neri:
Nitrogen bonding configurations near the oxynitride/silicon interface after oxynitridation in N2O ambient of a thin SiO2 gate. Microelectron. Reliab. 47(4-5): 822-824 (2007) - 2006
- [j6]Giovanni Busatto, Francesco Iannuzzo, Alberto Porzio, Annunziata Sanseverino, Francesco Velardi, Giuseppe Currò:
Experimental study of power MOSFET's gate damage in radiation environment. Microelectron. Reliab. 46(9-11): 1854-1857 (2006) - 2005
- [j5]Giacomo Barletta, Giuseppe Currò:
Junction leakage current degradation under high temperature reverse-bias stress induced by band-defect-band tunnelling in power VDMOS. Microelectron. Reliab. 45(5-6): 994-999 (2005) - [j4]Giovanni Busatto, Alberto Porzio, Francesco Velardi, Francesco Iannuzzo, Annunziata Sanseverino, Giuseppe Currò:
Experimental and Numerical investigation about SEB/SEGR of Power MOSFET. Microelectron. Reliab. 45(9-11): 1711-1716 (2005) - 2004
- [j3]Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Alberto Porzio, Annunziata Sanseverino, Giuseppe Currò, Alessandra Cascio, Ferruccio Frisina:
The Role of the Parasitic BJT Parameters on the Reliability of New Generation Power MOSFET during Heavy Ion Exposure. Microelectron. Reliab. 44(9-11): 1407-1411 (2004) - 2003
- [j2]Francesco Velardi, Francesco Iannuzzo, Giovanni Busatto, Jeffery Wyss, Annunziata Sanseverino, A. Candelori, Giuseppe Currò, Alessandra Cascio, Ferruccio Frisina:
Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment. Microelectron. Reliab. 43(9-11): 1847-1851 (2003) - 2002
- [j1]Giuseppe Currò, R. Greco, Antonino Scandurra:
Growth process and chemical characterization of an ultrathin phosphate film grafted onto Al-alloy metallization surfaces relevant to microelectronic devices reliability. Microelectron. Reliab. 42(9-11): 1659-1662 (2002)
Conference and Workshop Papers
- 2024
- [c1]Michele Ammendola, Giuseppe Massimiliano De Luca, Francesca Vescio, Nicola de'Angelis, Valeria Zuccalà, Andrea Balla, Umberto Bracale, Ludovica Guerriero, Giovanni Laracca, Vinicio Mosca, Domenico Spoletini, Monica Ortenzi, Diego Cuccurullo, Mario Testini, Giuseppe Navarra, Gabriele Anania, Pietro Mascagni, Silvia Curcio, Giuseppe Currò, Mohanad Al Ansari:
Avatar Surgeon, Digital Pathology and Telementoring: SICE New Technology and Training Research Group Experience. XR (2) 2024: 360-368
Coauthor Index
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