"Interface states and traps in thin N2O-grown oxynitride/oxide ..."

Giuseppe Currò et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.016

access: closed

type: Journal Article

metadata version: 2024-10-06

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Giuseppe Currò, Marco Camalleri, Denise Calì, Francesca Monforte, Fortunato Neri:
Interface states and traps in thin N₂O-grown oxynitride/oxide di-layer for PowerMOSFET devices. Microelectron. Reliab. 47(4-5): 819-821 (2007)

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