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Journal Articles
- 2015
[j12]Ivo Stachiv
, Te-Hua Fang, Yeau-Ren Jeng:
Mass Detection in Viscous Fluid Utilizing Vibrating Micro- and Nanomechanical Mass Sensors under Applied Axial Tensile Force. Sensors 15(8): 19351-19368 (2015)- 2009
- [j11]Shao-Shu Chu, Te-Hua Fang, Win-Jin Chang:
Modelling of coupled heat and moisture transfer in porous construction materials. Math. Comput. Model. 50(7-8): 1195-1204 (2009) - [j10]Wen-Yang Chang, Te-Hua Fang, Shao-Hsing Yeh, Yu-Cheng Lin:
Flexible Electronics Sensors for Tactile Multi-Touching. Sensors 9(2): 1188-1203 (2009) - 2008
- [j9]Te-Hua Fang, Tong Hong Wang, Deng-Maw Lu, Wen-Chieh Lien:
Structural characteristics of carbon nanostructures synthesized by ECR-CVD. Microelectron. J. 39(12): 1600-1604 (2008) - [j8]Chao-Ming Lin, Tzu-Chao Lin, Te-Hua Fang, Kuo-Sheng Chao:
Failure analysis of pad-height effects in the fine-pitch interconnection of the anisotropic conductive films. Microelectron. Reliab. 48(7): 1087-1092 (2008) - 2006
- [j7]Chao-Ming Lin, Win-Jin Chang, Te-Hua Fang:
Reliability analysis of the fine pitch connection using anisotropic conductive film (ACF). Microelectron. J. 37(7): 565-568 (2006) - [j6]Te-Hua Fang, Win-Jin Chang, Jun-Wei Chiu:
Study on coalescent properties of ZnO nanoclusters using molecular dynamics simulation and experiment. Microelectron. J. 37(8): 722-727 (2006) - 2005
- [j5]Te-Hua Fang, Win-Jin Chang, Sung-Lin Tsai:
Nanomechanical characterization of polymer using atomic force microscopy and nanoindentation. Microelectron. J. 36(1): 55-59 (2005) - 2004
- [j4]Te-Hua Fang, Win-Jin Chang:
Phase transformation of fullerenes using molecular dynamics simulation. Microelectron. J. 35(7): 581-583 (2004) - [j3]Te-Hua Fang, Win-Jin Chang:
Nanoindentation characteristics on polycarbonate polymer film. Microelectron. J. 35(7): 595-599 (2004) - [j2]Te-Hua Fang, Win-Jin Chang, Shi-Cheng Liao:
Effects of temperature and aperture size on nanojet ejection process by molecular dynamics simulation. Microelectron. J. 35(9): 687-691 (2004) - [j1]Te-Hua Fang:
Mechanisms of nanooxidation of Si(100) from atomic force microscopy. Microelectron. J. 35(9): 701-707 (2004)
Coauthor Index
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