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Arvind Jain
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2010 – 2019
- 2017
- [c10]Huaxing Tang, Arvind Jain, Sanil Kumark Pillai, Dharmesh Joshi, Shamitha Rao:
Using Cell Aware Diagnostic Patterns to Improve Diagnosis Resolution for Cell Internal Defects. ATS 2017: 231-236 - 2015
- [j4]Fotis Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji:
Time-Division Multiplexing for Testing DVFS-Based SoCs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(4): 668-681 (2015) - 2014
- [c9]Fotis Vartziotis, Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Rubin A. Parekhji, Arvind Jain:
Multi-site test optimization for multi-Vdd SoCs using space- and time- division multiplexing. DATE 2014: 1-6 - [i1]Yuchung Cheng, Jerry Chu, Sivasankar Radhakrishnan, Arvind Jain:
TCP Fast Open. RFC 7413: 1-26 (2014) - 2012
- [j3]Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji:
Test Schedule Optimization for Multicore SoCs: Handling Dynamic Voltage Scaling and Multiple Voltage Islands. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(11): 1754-1766 (2012) - [c8]Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji:
Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. ETS 2012: 1-6 - [c7]Arvind Jain, Maheedhar Jalasutram, Srinivas Vooka, Prasun Nair, Neeraj Pradhan:
At-speed Testing of Asynchronous Reset De-assertion Faults. VLSI Design 2012: 358-363 - 2011
- [j2]Arvind Jain, Sundarrajan Subramanian, Rubin A. Parekhji, Srivaths Ravi:
Design Techniques with Multiple Scan Compression CoDecs for Low Power and High Quality Scan Test. J. Low Power Electron. 7(4): 502-515 (2011) - [c6]Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji:
Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and Multiple Voltage Islands. Asian Test Symposium 2011: 33-39 - [c5]Sivasankar Radhakrishnan, Yuchung Cheng, Jerry Chu, Arvind Jain, Barath Raghavan:
TCP fast open. CoNEXT 2011: 21 - [c4]Trapti Jain, Arvind Jain:
Implementation of Artificial Neural Networks in Real Time Power System: Challenges and Issues. IICAI 2011: 343-352 - [c3]Arvind Jain, Sundarrajan Subramanian, Rubin A. Parekhji, Srivaths Ravi:
Multi-CoDec Configurations for Low Power and High Quality Scan Test. VLSI Design 2011: 370-375 - 2010
- [j1]Nandita Dukkipati, Tiziana Refice, Yuchung Cheng, Jerry Chu, Tom Herbert, Amit Agarwal, Arvind Jain, Natalia Sutin:
An argument for increasing TCP's initial congestion window. Comput. Commun. Rev. 40(3): 26-33 (2010)
2000 – 2009
- 2007
- [c2]Arvind Jain, S. C. Srivastava:
Optimal Bidding Strategy under Transmission Congestion using Genetic Algorithm. GEM 2007: 88-94 - [c1]Gurmeet Singh Manku, Arvind Jain, Anish Das Sarma:
Detecting near-duplicates for web crawling. WWW 2007: 141-150
Coauthor Index
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