"Design Techniques with Multiple Scan Compression CoDecs for Low Power and ..."

Arvind Jain et al. (2011)

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DOI: 10.1166/JOLPE.2011.1161

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type: Journal Article

metadata version: 2020-05-22

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Arvind Jain, Sundarrajan Subramanian, Rubin A. Parekhji, Srivaths Ravi:
Design Techniques with Multiple Scan Compression CoDecs for Low Power and High Quality Scan Test. J. Low Power Electron. 7(4): 502-515 (2011)

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