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ORCIDJean-Louis Carbonéro
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2010 – 2019
- 2010
[j4]Luca Testa
, Hervé Lapuyade, Yann Deval, Jean-Louis Carbonéro, Jean-Baptiste Bégueret:
Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors. J. Electron. Test. 26(3): 355-365 (2010)
2000 – 2009
- 2009
- [c7]Luca Testa, Hervé Lapuyade, Yann Deval, Olivier Mazouffre, Jean-Louis Carbonéro, Jean-Baptiste Bégueret:
BIST scheme for RF VCOs allowing the self-correction of the cut. ITC 2009: 1-10 - 2008
- [j3]Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro:
Decreasing Test Qualification Time in AMS and RF Systems. IEEE Des. Test Comput. 25(1): 29-37 (2008) - [j2]Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro:
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test. VLSI Design 2008: 596146:1-596146:9 (2008) - 2007
- [c6]Jeanne Tongbong, Salvador Mir, Jean-Louis Carbonéro:
Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model. DATE 2007: 731-736 - [c5]Luís Rolíndez, Salvador Mir, Jean-Louis Carbonéro, Dimitri Goguet, Nabil Chouba:
A stereo audio Σ∑ ADC architecture with embedded SNDR self-test. ITC 2007: 1-10 - [c4]Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro:
Qualification of behavioral level design validation for AMS & RF SoCs. VLSI-SoC 2007: 206-211 - 2006
- [j1]Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro:
A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electron. Test. 22(4-6): 325-335 (2006) - [c3]Yves Joannon, Vincent Beroulle, Rami Khouri, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro:
Behavioral Modeling of WCDMA Transceiver with VHDL-AMS Language. DDECS 2006: 113-118 - [c2]Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro:
A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. VTS 2006: 314-319 - 2005
- [c1]Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir:
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. DATE 2005: 170-171
Coauthor Index
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