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"Decreasing Test Qualification Time in AMS and RF Systems."

Yves Joannon et al. (2008)

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DOI: 10.1109/MDT.2008.7

access: closed

type: Journal Article

metadata version: 2022-04-09

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  persistent URL:
  - https://dblp.org/rec/journals/dt/JoannonBRTC08
Yves Joannon, Vincent Beroulle, Chantal Robach, Smail Tedjini, Jean-Louis Carbonéro:
Decreasing Test Qualification Time in AMS and RF Systems. IEEE Des. Test Comput. 25(1): 29-37 (2008)

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