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Joseph Rayhawk

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Conference and Workshop Papers

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2005
[c5]
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  - conf/itc/PowellKRM05
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Theo J. Powell, Amrendra Kumar, Joseph Rayhawk, Nilanjan Mukherjee:
Chasing subtle embedded RAM defects for nanometer technologies. ITC 2005: 9
2004
[c4]
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Xiaogang Du, Sudhakar M. Reddy, Wu-Tung Cheng, Joseph Rayhawk, Nilanjan Mukherjee:
At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories. VLSI Design 2004: 895-900
[c3]
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Xiaogang Du, Sudhakar M. Reddy, Don E. Ross, Wu-Tung Cheng, Joseph Rayhawk:
Memory BIST Using ESP. VTS 2004: 243-248
2003
[c2]
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Xiaogang Du, Sudhakar M. Reddy, Joseph Rayhawk, Wu-Tung Cheng:
Testing Delay Faults in Embedded CAMs. Asian Test Symposium 2003: 378-383
[c1]
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Theo J. Powell, Wu-Tung Cheng, Joseph Rayhawk, Omer Samman, Paul Policke, Sherry Lai:
BIST for Deep Submicron ASIC Memories with High Performance Application. ITC 2003: 386-392

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