"Chasing subtle embedded RAM defects for nanometer technologies."

Theo J. Powell et al. (2005)

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DOI: 10.1109/TEST.2005.1584048

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Theo J. Powell, Amrendra Kumar, Joseph Rayhawk, Nilanjan Mukherjee:
Chasing subtle embedded RAM defects for nanometer technologies. ITC 2005: 9

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