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Steven W. Mittl

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Journal Articles

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1999
[j1]
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W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric D. Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel:
Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM J. Res. Dev. 43(3): 407-416 (1999)

Conference and Workshop Papers

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2015
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Steven W. Mittl, Fernando Guarin:
Self-heating and its implications on hot carrier reliability evaluations. IRPS 2015: 4
2005
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Matthew J. Breitwisch, Chung Hon Lam, Jeffrey B. Johnson, Steven W. Mittl, Jian W. Zhu:
A novel CMOS compatible embedded nonvolatile memory with zero process adder. MTDT 2005: 9-12

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