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David W. Conkle

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1990 – 1999

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1999
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W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric D. Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel:
Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM J. Res. Dev. 43(3): 407-416 (1999)

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