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Giannis P. Kontogiannopoulos

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Journal Articles

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2010
[j2]
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  - https://dblp.org/rec/journals/mr/MoschouKKV10
Despina C. Moschou, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
On the importance of the V_{g, max}-V_th parameter on LTPS TFT stressing behavior. Microelectron. Reliab. 50(2): 190-194 (2010)
2007
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F. V. Farmakis, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress. Microelectron. Reliab. 47(9-11): 1434-1438 (2007)

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