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F. V. Farmakis

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2000 – 2009

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2007
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F. V. Farmakis, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress. Microelectron. Reliab. 47(9-11): 1434-1438 (2007)
2003
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N. A. Hastas, C. A. Dimitriadis, F. V. Farmakis, G. Kamarinos:
Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors. Microelectron. Reliab. 43(4): 671-674 (2003)

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