"Degradation of double-gate polycrystalline silicon TFTs due to hot carrier ..."

F. V. Farmakis et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.030

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type: Journal Article

metadata version: 2020-02-22

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F. V. Farmakis, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas:
Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress. Microelectron. Reliab. 47(9-11): 1434-1438 (2007)

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