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Maria Ruzzarin
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2010 – 2019
- 2019
- [c2]Maria Ruzzarin
, Matteo Borga
, Enrico Zanoni
, Matteo Meneghini, Gaudenzio Meneghesso, Dong Ji, Wenwen Li, Silvia H. Chan, Anchal Agarwal, Chirag Gupta
, Stacia Keller, Umesh K. Mishra, Srabanti Chowdhury
:
Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based Vertical Trench MOSFETs (OG-FETs). IRPS 2019: 1-5 - 2018
- [j3]Gaudenzio Meneghesso, Matteo Meneghini
, Carlo De Santi
, Maria Ruzzarin
, Enrico Zanoni
:
Positive and negative threshold voltage instabilities in GaN-based transistors. Microelectron. Reliab. 80: 257-265 (2018) - [j2]Maria Ruzzarin
, Matteo Meneghini
, Carlo De Santi
, Min Sun, Tomás Palacios, Gaudenzio Meneghesso, Enrico Zanoni
:
Degradation of vertical GaN-on-GaN fin transistors: Step-stress and constant voltage experiments. Microelectron. Reliab. 88-90: 620-626 (2018) - [c1]Maria Ruzzarin
, Matteo Meneghini
, Carlo De Santi
, Gaudenzio Meneghesso, Enrico Zanoni
, Min Sun, Tomás Palacios:
Degradation of vertical GaN FETs under gate and drain stress. IRPS 2018: 4 - 2016
- [j1]Isabella Rossetto, Matteo Meneghini
, Vanessa Rizzato, Maria Ruzzarin
, Andrea Favaron, Steve Stoffels
, Marleen Van Hove, Niels Posthuma, Tian-Li Wu
, Denis Marcon, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni
:
Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis. Microelectron. Reliab. 64: 547-551 (2016)
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