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ORCIDKwame Osei Boateng
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2020 – today
- 2020
[j5]Henry Nunoo-Mensah
, Kwame Osei Boateng, James Dzisi Gadze:
PSTRM: Privacy-aware sociopsychological trust and reputation model for wireless sensor networks. Peer-to-Peer Netw. Appl. 13(5): 1505-1525 (2020)
2010 – 2019
- 2018
- [j4]Henry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze:
The adoption of socio- and bio-inspired algorithms for trust models in wireless sensor networks: A survey. Int. J. Commun. Syst. 31(7) (2018) - 2017
- [j3]Henry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze:
Tamper-aware authentication framework for wireless sensor networks. IET Wirel. Sens. Syst. 7(3): 73-81 (2017) - 2015
- [c9]Julius Quarshie Azasoo, Kwame Osei Boateng:
A Retrofit Design Science Methodology for Smart Metering Design in Developing Countries. ICCSA (Short Papers/poster papers/PhD student showcase works) 2015: 1-7 - 2013
- [j2]K. A. Bonsu, Kwame Osei Boateng, J. K. Oppong, Koffi A. Dotche:
Small-Scale Fading Characteristics in Cellular Networks in Ghana. Int. J. Interdiscip. Telecommun. Netw. 5(3): 23-33 (2013)
2000 – 2009
- 2003
- [c8]Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama:
BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364 - 2002
- [j1]Hiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu:
On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(3): 362-368 (2002) - 2001
- [c7]Kwame Osei Boateng, Hideaki Konishi, Tsuneo Nakata:
A Method of Static Compaction of Test Stimuli. Asian Test Symposium 2001: 137-144 - 2000
- [c6]Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu:
General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. VTS 2000: 171-178
1990 – 1999
- 1999
- [c5]Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida:
Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. Asian Test Symposium 1999: 341-346 - [c4]Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu:
A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. VTS 1999: 64-69 - 1998
- [c3]Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu:
Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. Asian Test Symposium 1998: 108-112 - 1997
- [c2]Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu:
Design of C-Testable Multipliers Based on the Modified Booth Algorithm. Asian Test Symposium 1997: 42-47 - [c1]Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga:
A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. Asian Test Symposium 1997: 320-325
Coauthor Index
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