"General BIST-Amenable Method of Test Generation for Iterative Logic Arrays."

Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu (2000)

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DOI: 10.1109/VTEST.2000.843842

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu:
General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. VTS 2000: 171-178

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